Learn efficient troubleshooting techniques for Airborne Molecular Contamination monitoring
On Demand Webinar
Decreasing the time to detect, contain and mitigate very low levels of Airborne Molecular Contamination (AMC) is critical for high tech manufacturers. Costs associated with AMC-related quality issues and yield losses are well understood, and adequate reduction of AMC is critical for clean manufacturers to stay competitive.
Technical personnel need the flexibility to efficiently collect AMC data with good temporal-spatial resolution anywhere in the clean environment, for both sustaining sample plans as well as collecting site-specific data to converge on AMC sources during troubleshooting events. Dr. Dan Rodier will provide a brief overview of AMC along with the latest technology for efficiently identifying AMC sources in the cleanroom.
Presenter: Dan Rodier, Ph.D, Technology Development Manager, Electronics Division Particle Measuring Systems
Dr. Rodier has a Ph.D. in analytical chemistry from the University of Colorado and has over 25 years of experience developing and implementing technologies and strategies to measure airborne molecular species and particulate contamination. He has worked with customers across Asia, Europe, and North America to implement monitoring programs in the semiconductor, disk drive, and display industries.